本书为“国外电子信息精品著作”影印版之一，介绍了集成电路的统计CAD工具的相关知识。主要面向CAD工具开发人员、集成电路工艺技术人员，以及相关学科的学生和研究人员。书中介绍了统计时序和功耗分析技术中的最新研究成果，并结合参数化的产量作为设计过程中的主要目标函数。

本书既可作为刚涉足CAD工具开发领域的人员的入门书籍，也可作为该领域工程师的参考手册。

该书介绍了集成电路的统计CAD工具的相关知识。主要面向CAD工具开发人员、集成电路工艺技术人员，以及相关学科的学生和研究人员。书中介绍了统计时序和功耗分析技术中的最新研究成果，并结合参数化的产量作为设计过程中的主要目标函数。该书强调算法、过程变量的建模方法，以及统计方法。既可作为刚涉足CAD工具开发领域的人员的入门书籍，也可作为该领域工程师的参考手册。

Preface

Introduction

1.1 Sources of Variations

    1.1.1 Process Variations

    1.1.2 Environmental Variations

    1.1.3 Modeling Variations

    1.1.4 Other Sources of Variations

1.2 Components of Variation

    1.2.1 Inter-die Variations

    1.2.2 Intra-die Variations

1.3 Impact on Performance

Statistical Models and Techniques.

2.1 Monte Carlo Techniques

    2.1.1 Sampling Probability Distributions

2.2 Process Variation Modeling

    2.2.1 Pelgrom's Model

    2.2.2 Principal Components Based Modeling

    2.2.3 Quad-Tree Based Modeling

    2.2.4 Specialized Modeling Techniques

 2.3 Performance Modeling

    2.3.1 Response Surface Methodology

    2.3.2 Non-Normal Performance Modeling

    2.3.3 Delay Modeling

    2.3.4 Interconnect Delay Models

    2.3.5 Reduced-Order Modeling Techniques

 Statistical Timing Analysis

 3.1 Introduction

 3.2 Block-Based Timing Analysis

    3.2.1 Discretized Delay PDFs

    3.2.2 Reconvergent Fanouts

    3.2.3 Canonical Delay PDFs

    3.2.4 Multiple Input Switching

3.3 Path-Based Timing Analysis

3.4 Parameter-Space Techniques

    3.4.1 Parallelepiped Method

    3.4.2 Ellipsoid Method

    3.4.3 Case-File Based Models for Statistical Timing

3.5 Bayesian Networks

4  Statistical Power Analysis

4.1 Overview

4.2 Leakage Models

4.3 High-Level Statistical Analysis

4.4 Gate-Level Statistical Analysis

    4.4.1 Dynamic Power

    4.4.2 Leakage Power

    4.4.3 Temperature and Power Supply Variations

Yield Analysis

5.1 High-Level Yield Estimation

    5.1.1 Leakage Analysis

    5.1.2 Frequency Binning

    5.1.3 Yield Computation

5.2 Gate-Level Yield Estimation

    5.2.1 Timing Analysis

    5.2.2 Leakage Power Analysis

    5.2.3 Yield Estimation

 5.3 Supply Voltage Sensitivity

 Statistical Optimization Techniques

 6.1 Optimization of Process Parameters

    6.1.1 Timing Constraint

    6.1.2 Objective Function

    6.1.3 Yield Allocation

 6.2 Gate Sizing

    6.2.1 Nonlinear Programming

    6.2.2 Lagrangian Relaxation

    6.2.3 Utility Theory

    6.2.4 Robust Optimization

    6.2.5 Sensitivity-Based Optimization

 6.3 Buffer Insertion

    6.3.1 Deterministic Approach

    6.3.2 Statistical Approach

 6.4 Threshold Voltage Assignment

    6.4.1 Sensitivity-Based Optimization

    6.4.2 Dynamic Programming

References

Index