本书是国外电子信息精品著作。在ADCs设计中，准确地知道其动态行为的特征参数非常重要。本书讨论了三种典型的测试ADCs的动态性能的方法，也给出了另外一种测试方法，这种方法避免了典型方法的限制。动态特性是衡量ADC性能的决定性指标之一，本书给出了测试方法、影响动态特性的因素以及解决方案。

在ADCs设计中，准确地知道其动态行为的特征参数非常重要。本书讨论了三种典型的测试ADCs的动态性能的方法，也给出了另外一种测试方法，这种方法避免了典型方法的限制。动态特性是衡量ADC性能的决定性指标之一，本书给出了测试方法、影响动态特性的因素以及解决方案。

Preface

Introduction

Jose Machado da Silva

Glossary

Part I ADC Characterisation Based on Sinewave Analysis

1

ADC Applications, Architectures and Terminology

Jose Machado da Silva, Helio Mendonga

1.  Introduction

2.  ADCs' applications

3.  ADCs' architectures

4.  Terminology

5.  Quantisation and A/D conversion

6.  Output coding

7.  Errors, non-linearity, noise, and distortion

8.  Data acquisition and processing

9.  Input characteristics

Sinewave Test Setup

Pierre-Yves Roy, Jacques Durand

1.  Test Setup description

2.  Specification of the clock and input signal

3.  Example of filter specification

4.  Filter selection

5.  Taking a record of data

Time-Domain Data Analysis

Dominique Dallet, Djamel Haddadi, Philippe Marchegay

1.  Introduction

2.  Calculation of the dynamic parameters

3.  Definitions

4.   The fixed-frequency method

5.   The four-parameter method

6.   Definitions of THD and SNR

7.  The multi-harmonic sine-wave fitting method

8.  Estimation of the normalised angular frequency

9.  Estimation of the linear parameters

10.  On the rank of Ep

11.  The algorithm

12.  Multitone test to circumvent signal purity problems

4

Frequency-Domain Data Analysis

Pierre- Yves Roy, Jacques Durand

1.   Discrete Fourier Transform and Fast Fourier Transform

2.  Choice of input and clock frequencies

3.  Windowing

4.  Comment on the accuracy of the input frequency

5.   Record size

6.   Calculation of ADC dynamic parameters in the frequency domain

Code Histogram Test

Giovanni Chiorboli, Carlo Morandi

1.   Introduction

2.   The sampling strategy and its contribution to count variance and

     measurement uncertamty

3.   Additional contributions to count uncertainty: additive noise and

     jitter

4.   Factors affecting the p.d.f, of the input signal

5.  Required record length and number of records, expression of mea-

     surement uncertainty

6.  Choice of the coverage factor

7.   Comparing the number of samples required by random and by syn-

     chronous sampling.

8.   Determining the transfer characteristic

9.   Offset error and gain

10.  Linearity errors

11.  Appendix

Comparative Study of ADC Sinewave Test Methods

JoseMachado da Silva, Helio Mendonga, Sara Mazoleni

1.   Introduction

2.  General considerations

3.   Simulation results

4.  ATE Implementation

5.  Conclusions

Part II Measurement of Additional Parameters

7

Jitter Measurement

Pierre-Yves Roy, Jacques Durand

  1.  Introduction

  2.  The double beat technique

  3.  The joint probability technique

  4.  Conclusion

Differential Gain and Phase Testing

JoseMachado da Silva, Helio Mendonga

  1.  Introduction

  2.  Test setup and hardware requirements

  3.  Analysis

  4.  Test results

  5.  Calculation of differential gain and phase from the test results

Step and Transient Response Measurement

Giovanni Chiorboli, Carlo Morandi

  1.  Introduction

  2.  Settling time and transition duration of step response

  3.  Frequency response measurement

10

Hysteresis Measurement

Giovanni Chiorboli Carlo Morandi

  1.  Introduction

  2.  Test conditions

  3.  A practical case

  4.  Collection of samples in HC↑ and HC↓

  5.  Some warning

References

Index